DFX 2022 33rd SYMPOSIUM DESIGN FOR X
The 33rd DfX Symposium will take place on 22nd & 23rd September 2022 in Hamburg.. DFX 2022 offers young scientists a platform for presenting new ideas and approaches for improving product development.
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Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements
Julian Peters (1), Christoph Zimmerer (1), Thomas Gwosch (1), Felix Herbst (2), Claas Hartmann (2), Romol Chadda (2), David Riehl (3), Ferdinand Keil (3), Mario Kupnik (2), Klaus Hofmann (3), Sven Matthiesen (1)
Type:
Year:
2022
Editor:
Dieter Krause, Kristin Paetzold, Sandro Wartzack
Author:
Series:
DfX
Page(s):
10
DOI number:
Abstract:
Sensor-integrating machine elements (SiME) are essential enablers for digitization in the industry. There are major challenges in the development of SiME as an interdisciplinary mechatronic system, requiring methodical support. In this work, we address these challenges and aim to provide methods and tools by analyzing the state-of-the-art and ten ongoing projects of sensor integration in machine elements. Clustering shows similarities for example in the identification of design space or weakening of the structure. Based on this, a test-driven development process with a focus on interdisciplinary negotiations and iterations is described to overcome the challenges in developing SiME.
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