Conditional DSM

DSM 2012 Proceedings of the 14th International DSM Conference, Kyoto, Japan

Year: 2012
Editor: Onishi, M.; Maurer, M.; Kirner, K.; Lindemann, U.
Author: Chang, C.-W.; Chiang, D.M.
Series: DSM
Institution: 1: Innovation Institute of Technology, China; 2: National Taiwan University, Taiwan
Section: Modelling Approaches and Information Acquisition
Page(s): 91-99
ISBN: 978-3-446-43354-0

Abstract

Identifying critical activities or subsystems is usually the first step in reducing the complexity of systems. The design structure matrix (DSM) is a highly effective tool for managing a complex system
by identifying and prioritizing critical activities. However, a standard DSM has limited application to systems with prior known conditions or practical application constraints. In this paper, we develop a conditional DSM in order to identify critical features under some prior known conditions or existing constraints. This method of analysis is applied to a wafer fabrication case to verify its utility. In
addition, this paper aims to make the DSM far more effective and broad in its application.

Keywords: Conditional constraints, semiconductor manufacture, critical feature