Proposition of a Maturity Grid to Assess NPD Agility
Year: 2009
Section: Design Organization and Management
Editor: Norell Bergendahl, M.; Grimheden, M.; Leifer, L.; Skogstad, P.; Lindemann, U.
Author: Wieder, Charlotte; Le Dain, Marie-Anne; Blanco, Eric
Section: Design Organization and Management
Pages: 85-96
Abstract
Since the mid 90's, the manufacturers need to renew continuously their product offers, to thrive in more competitive and turbulent markets. However, the implementation of continuous innovation approaches impacts their existing NPD process, in terms of organisation, processes and skills. The issue addressed in this paper is how can they integrate in continuous way innovations into their NPD process, without to degrade its performance objective? By mobilising the literature on continuous innovation, open innovation and agility, we argue that these manufacturers need to have an agile NPD process to successfully absorb innovations into the NPD process. The main contribution of this paper is the presentation of the NPD agility concept with its associated capabilities. Four practices areas are suggested, to assess the NPD agility. Combined with the identification of four maturity levels and associated engineering practices, they constitute the analysis framework of a maturity grid, aiming at assessing the NPD agility. This research is performed in partnership with PCO Innovation, a consulting company, willing to support its clients on this new issue.
Keywords: NPD agility, RID model, open innovation, maturity grid, consulting
The Design Society and the Stanford Center for Design Research cordially invite you to participate in the International Conference on Engineering Design, ICED'09. The venue will be Stanford University’s verdant campus in the heart of Silicon Valley, a short 35 miles south of San Francisco, California. Research papers and case studies are solicited on any topic related to design thinking, theory, and practice, with a premium placed on evidence-based research. Topics and Themes include: *...


